NXP Semiconductors /QN908XC /CALIB /CTRL

Text Text Text Text Text Text Text Text Text Text Text Text Text Text Text Text Text Text Text Text Text Text Text Text Text Text Text

Interpret as CTRL

31 2827 2423 2019 1615 1211 87 43 0 0 0 0 0 0 0 0 00 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0RC_TIM 0 (VCO_TEST_INT)VCO_TEST_INT 0 (HOP_CLB_SEL)HOP_CLB_SEL 0XTL_PO_TIM 0XTL_CAL_TIM 0 (PO1MS)XTL_AMP_DET_PWR_SEL 0 (XTL_SWCAL_EN)XTL_SWCAL_EN

XTL_AMP_DET_PWR_SEL=PO1MS

Description

Reserved

Fields

RC_TIM

RC calibration reset time

VCO_TEST_INT

no description available

HOP_CLB_SEL

Frequency hop calibration start select

XTL_PO_TIM

crystal calibration power on wait time

XTL_CAL_TIM

crystal calibration code wait time

XTL_AMP_DET_PWR_SEL

crystal amplitude detector power select

0 (PO1MS): power on detector only 1ms each code

1 (POCAL): power on detector during all calibration time

2 (POALWAYS): always power on detector

3 (PDALWAYS): always power down detector

XTL_SWCAL_EN

crystal software calibration enable

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